Vol. 6 No. 5
Regular Issue
S&M168Letter |
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S&M168 Thermal Vacuum Sensor by CMOS IC Technology and Sacrificial Metal Etching Oliver Paul and Henry Baltes |
S&M169Research Paper |
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S&M169 High-Precision Processing System for Thinning of Glass Substrates with Interference Filter Films and Its Characteristics Toshiroh Karaki-Doy and Toshio Kasai |
S&M170Research Paper |
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S&M170 Technology for III-V-Based Integrated Optical Sensors Hans P. Zappe, Hazel E. G. Arnot and Rino E. Kunz |
S&M171Research Paper |
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S&M171 Measurements of Attenuation Losses and of Light Distribution in Thick-Film Optical Waveguides Franco Docchio, Daniele Marioli, Giovanna Sansoni and Andrea Taroni |
S&M172Research Paper |
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S&M172 High-Performance In0.53Ga0.47As/InP Hall Sensors with Doped and 2DEG Channels and Screening Front and Back Gate Layers R. Kyburz, J. Schmid, R. S. Popovic and H. Melchior |
S&M173Research Paper |
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S&M173 Characteristics of Quasi Buckling Jan Söderkvist and Ulf Lindberg |
S&M174Research Paper |
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S&M174 Selective Growth of Polycrystalline Diamond Thin Films Using Bias-Enhanced MPCVD Minyao Mao, Changjun Kang, Xikang Zhang, Songsheng Tan, Weiyuan Wang, Zhicheng Zhuang and Xiaofeng Jing |
Cover of this Issue |
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