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S&M1040 Research Paper of Special Issue https://doi.org/10.18494/SAM.2015.1063 Published: January 29, 2015 Vibration Analysis and Evaluation of Piezoelectric Micromachined Ultrasonic Transducers Using Epitaxial Pb(Zr, Ti)O3 Thin Film [PDF] Daisuke Takashima, Katsuya Ozaki, Masato Nishimura, Nagaya Okada, Daisuke Akai, and Makoto Ishida (Received July 13, 2014; Accepted November 20, 2014) Keywords: pMUT, ultrasonic, PZT, γ-Al2O3, FEM
To improve the transmitting and receiving characteristics of piezoelectric micromachined ultrasonic transducers (pMUTs), the thickness of the diaphragm material SiNx of the pMUT was investigated by vibration analysis using the finite element method (FEM). The vibration magnitudes increase 1.7-fold by changing the SiNx thickness from 1.0 to 0.5 µm as determined by the FEM results. A pMUT with a new structure that has a 0.5-µm-thick SiNx layer was fabricated and evaluated. The vibration of the pMUT was evaluated by a laser Doppler vibrometer (LDV), and the vibration magnitude of the fabricated pMUT was threefold that of our previously reported pMUT. Ultrasonic characteristics such as transmitted ultrasonic sound pressure and ultrasonic sensitivity are also evaluated and compared with those of the previous pMUT. The fabricated pMUT shows 11 times larger transmitted ultrasonic sound pressure and 5 times larger ultrasonic sensitivity than those exhibited by the previous pMUT.
Corresponding author: Daisuke AkaiCite this article Daisuke Takashima, Katsuya Ozaki, Masato Nishimura, Nagaya Okada, Daisuke Akai, and Makoto Ishida, Vibration Analysis and Evaluation of Piezoelectric Micromachined Ultrasonic Transducers Using Epitaxial Pb(Zr, Ti)O3 Thin Film, Sens. Mater., Vol. 27, No. 1, 2015, p. 1-10. |