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Vol. 32, No. 8(2), S&M2292

Print: ISSN 0914-4935
Online: ISSN 2435-0869
Sensors and Materials
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Sensors and Materials, Volume 27, Number 10 (2015)
Copyright(C) MYU K.K.
pp. 985-991
S&M1135 Research Paper of Special Issue
https://doi.org/10.18494/SAM.2015.1170
Published: November 11, 2015

Imaging of Localized Surface Plasmon by Apertureless Scanning Near-Field Optical Microscopy [PDF]

Soushi Ikeda, Yongfu Cai, Qianwen Meng, Taichi Yokoyama, Kenji Shinozaki, Takayuki Komatsu and Takayuki Ishibashi

(Received February 16, 2015; Accepted May 25, 2015)

Keywords: surface plasmon polariton, apertureless scanning near-field optical microscopy, cross grooves

We measured the distribution of surface plasmon polaritons (SPPs) on cross grooves fabricated in Au film by apertureless scanning near-field optical microscopy (aSNOM). SNOM signals around horizontal and vertical grooves had double peaks and a single peak, respectively. To understand these different behaviors, we carried out simulations by the finite element method. From the simulation results, we found that the double peaks that appeared near the left and right edges of the horizontal groove were due to localized surface plasmons (LSPs). On the other hand, the strong signal that appeared near the center of the vertical groove was due to channel plasmon polariton. The SPP excitation depended on the direction of the electric field of the incident light and the cross sections of the grooves. This experiment reveals that aSNOM is a powerful tool for observing the distribution of SPPs on the nanoscale.

Corresponding author: Yongfu Cai


Cite this article
Soushi Ikeda, Yongfu Cai, Qianwen Meng, Taichi Yokoyama, Kenji Shinozaki, Takayuki Komatsu and Takayuki Ishibashi, Imaging of Localized Surface Plasmon by Apertureless Scanning Near-Field Optical Microscopy, Sens. Mater., Vol. 27, No. 10, 2015, p. 985-991.



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