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Notice of retraction
Vol. 34, No. 8(3), S&M3042

Notice of retraction
Vol. 32, No. 8(2), S&M2292

Print: ISSN 0914-4935
Online: ISSN 2435-0869
Sensors and Materials
is an international peer-reviewed open access journal to provide a forum for researchers working in multidisciplinary fields of sensing technology.
Sensors and Materials
is covered by Science Citation Index Expanded (Clarivate Analytics), Scopus (Elsevier), and other databases.

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Sensors and Materials, Volume 30, Number 4(2) (2018)
Copyright(C) MYU K.K.
pp. 885-891
S&M1546 Technical Paper of Special Issue
https://doi.org/10.18494/SAM.2018.1791
Published: April 27, 2018

Design of UV Laser Parameters on Grooving Depth for Die Attach Film [PDF]

Te-Jen Su, Yi-Feng Chen, Jui-Chuan Cheng, and Chien-Liang Chiu

(Received October 30, 2017; Accepted January 24, 2018)

Keywords: UV laser, grooving depth, die attach film

A die attach film (DAF) is a material that is used to attach dies to a substrate or lead frame during the die attach manufacturing step in the semiconductor IC assembly process, and the DAF UV laser half cut is a manufacturing step in the semiconductor IC assembly process, and the cutting performance affects the die bond chip pickup yield. Therefore, the optimization of laser half cut parameters is very important. In this work, different laser parameters were studied to find the significant factor parameters followed by the fine tuning of the optimization condition. Experimental results showed that the laser power and cutting feed speed are the significant parameters for achieving laser cutting quality. According to the design of experiment (DOE) results, in the laser power range of 0.5–0.8 W, the cutting feed speed range is 45–65 mm/s and the grooving depth is 15–20 µm, which are the optimized conditions of a 20-µm-thick DAF.

Corresponding author: Te-Jen Su


Cite this article
Te-Jen Su, Yi-Feng Chen, Jui-Chuan Cheng, and Chien-Liang Chiu, Design of UV Laser Parameters on Grooving Depth for Die Attach Film, Sens. Mater., Vol. 30, No. 4, 2018, p. 885-891.



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