Young Researcher Paper Award 2023
🥇Winners

Notice of retraction
Vol. 34, No. 8(3), S&M3042

Notice of retraction
Vol. 32, No. 8(2), S&M2292

Print: ISSN 0914-4935
Online: ISSN 2435-0869
Sensors and Materials
is an international peer-reviewed open access journal to provide a forum for researchers working in multidisciplinary fields of sensing technology.
Sensors and Materials
is covered by Science Citation Index Expanded (Clarivate Analytics), Scopus (Elsevier), and other databases.

Instructions to authors
English    日本語

Instructions for manuscript preparation
English    日本語

Template
English

Publisher
 MYU K.K.
 Sensors and Materials
 1-23-3-303 Sendagi,
 Bunkyo-ku, Tokyo 113-0022, Japan
 Tel: 81-3-3827-8549
 Fax: 81-3-3827-8547

MYU Research, a scientific publisher, seeks a native English-speaking proofreader with a scientific background. B.Sc. or higher degree is desirable. In-office position; work hours negotiable. Call 03-3827-8549 for further information.


MYU Research

(proofreading and recording)


MYU K.K.
(translation service)


The Art of Writing Scientific Papers

(How to write scientific papers)
(Japanese Only)

Sensors and Materials, Volume 34, Number 5(4) (2022)
Copyright(C) MYU K.K.
pp. 2007-2013
S&M2950 Technical Paper of Specal Issue
https://doi.org/10.18494/SAM3911
Published: May 31, 2022

Optoelectronics Inspection of Amorphous In–Ga–Zn–O-based Active-matrix Thin-film Transistor Array for Foldable Substrate Applications [PDF]

Shih-Hung Lin, Chi-Hang Siu, Yuan-Ting Wang, and Yao-Chin Wang

(Received March 31, 2022; Accepted May 12, 2022)

Keywords: inspection, IGZO, thin-film transistor, foldable device

In this study, we report the flaw detection properties of amorphous In–Ga–Zn–O (IGZO)-based active-matrix thin-film transistors (TFTs) on foldable device applications. Foldable and thinned-glass substrates are two different types of critical flexible substrate for defect inspection, which are also difficult to check by traditional in situ inspection techniques for mass production. The technique we proposed is based on the noninvasive optoelectronic transforming principle to inspect flaw pixels, with the advantages of an ultrahigh resolution, a small pixel array, and no contact damage. This method can be applied to foldable substrates with an ultrahigh-definition (UHD) TFT array panel and digital X-ray detectors. The experimental data showed good flaw detection rate (>90.1%) and fail detection rate (<4.9%).

Corresponding author: Yao-Chin Wang


Creative Commons License
This work is licensed under a Creative Commons Attribution 4.0 International License.

Cite this article
Shih-Hung Lin, Chi-Hang Siu, Yuan-Ting Wang, and Yao-Chin Wang, Optoelectronics Inspection of Amorphous In–Ga–Zn–O-based Active-matrix Thin-film Transistor Array for Foldable Substrate Applications, Sens. Mater., Vol. 34, No. 5, 2022, p. 2007-2013.



Forthcoming Regular Issues


Forthcoming Special Issues

Special Issue on Applications of Novel Sensors and Related Technologies for Internet of Things
Guest editor, Teen-Hang Meen (National Formosa University), Wenbing Zhao (Cleveland State University), and Cheng-Fu Yang (National University of Kaohsiung)
Call for paper


Special Issue on Advanced Sensing Technologies for Green Energy
Guest editor, Yong Zhu (Griffith University)
Call for paper


Special Issue on Room-temperature-operation Solid-state Radiation Detectors
Guest editor, Toru Aoki (Shizuoka University)
Call for paper


Special Issue on International Conference on Biosensors, Bioelectronics, Biomedical Devices, BioMEMS/NEMS and Applications 2023 (Bio4Apps 2023)
Guest editor, Dzung Viet Dao (Griffith University) and Cong Thanh Nguyen (Griffith University)
Conference website
Call for paper


Special Issue on Advanced Sensing Technologies and Their Applications in Human/Animal Activity Recognition and Behavior Understanding
Guest editor, Kaori Fujinami (Tokyo University of Agriculture and Technology)
Call for paper


Special Issue on Signal Collection, Processing, and System Integration in Automation Applications
Guest editor, Hsiung-Cheng Lin (National Chin-Yi University of Technology)
Call for paper


Copyright(C) MYU K.K. All Rights Reserved.