Published: November 8, 2022
Characterization of Polymerized Layer of Alkylsilane on Surfaces of Silica Filler Materials by Force Spectroscopic Measurements Using Atomic Force Microscope [PDF]
Yuki Arai and Tomohiro Hayashi
(Received September 14, 2022; Accepted September 26, 2022)
Keywords: silica filler, force spectroscopy, atomic force microscopy, alkylsilane, polymer film
We demonstrated the characterization of silica filler materials by force spectroscopic measurements using an atomic force microscope. Our measurement revealed the local thickness distribution of a film of polymerized alkylsilane around silica colloids at nanometer resolution. In addition, our method enabled us to monitor the changes in the thickness distribution after chemical treatment of the materials. These findings cannot be obtained with other popular surface analytical techniques such as X-ray photoelectron spectroscopy and scanning electron microscopy. Our analytical approach is expected to contribute to the evaluation of local distributions of polymeric materials and nanoparticles and to the design of new filler materials in the future.Corresponding author: Yuki Arai, Tomohiro Hayashi
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Cite this article
Yuki Arai and Tomohiro Hayashi , Characterization of Polymerized Layer of Alkylsilane on Surfaces of Silica Filler Materials by Force Spectroscopic Measurements Using Atomic Force Microscope, Sens. Mater., Vol. 34, No. 11, 2022, p. 3959-3965.