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Print: ISSN 0914-4935
Online: ISSN 2435-0869
Sensors and Materials
is an international peer-reviewed open access journal to provide a forum for researchers working in multidisciplinary fields of sensing technology.
Online: ISSN 2435-0869
Sensors and Materials
is an international peer-reviewed open access journal to provide a forum for researchers working in multidisciplinary fields of sensing technology.
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Sensors and Materials
is covered by Science Citation Index Expanded (Clarivate Analytics), Scopus (Elsevier), and other databases.
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Sensors and Materials
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is covered by Science Citation Index Expanded (Clarivate Analytics), Scopus (Elsevier), and other databases.
Instructions to authors
English 日本語
Instructions for manuscript preparation
English 日本語
Template
English
Publisher
MYU K.K.
Sensors and Materials
1-23-3-303 Sendagi,
Bunkyo-ku, Tokyo 113-0022, Japan
Tel: 81-3-3827-8549
Fax: 81-3-3827-8547
MYU Research, a scientific publisher, seeks a native English-speaking proofreader with a scientific background. B.Sc. or higher degree is desirable. In-office position; work hours negotiable. Call 03-3827-8549 for further information.
MYU Research
(proofreading and recording)
MYU K.K.
(translation service)
The Art of Writing Scientific Papers
(How to write scientific papers)
(Japanese Only)
Sensors and Materials, Volume 34, Number 11(1) (2022)
Copyright(C) MYU K.K.
Copyright(C) MYU K.K.
|
pp. 3959-3965
S&M3089 Letter https://doi.org/10.18494/SAM4101 Published: November 8, 2022 Characterization of Polymerized Layer of Alkylsilane on Surfaces of Silica Filler Materials by Force Spectroscopic Measurements Using Atomic Force Microscope [PDF] Yuki Arai and Tomohiro Hayashi (Received September 14, 2022; Accepted September 26, 2022) Keywords: silica filler, force spectroscopy, atomic force microscopy, alkylsilane, polymer film
We demonstrated the characterization of silica filler materials by force spectroscopic measurements using an atomic force microscope. Our measurement revealed the local thickness distribution of a film of polymerized alkylsilane around silica colloids at nanometer resolution. In addition, our method enabled us to monitor the changes in the thickness distribution after chemical treatment of the materials. These findings cannot be obtained with other popular surface analytical techniques such as X-ray photoelectron spectroscopy and scanning electron microscopy. Our analytical approach is expected to contribute to the evaluation of local distributions of polymeric materials and nanoparticles and to the design of new filler materials in the future.
Corresponding author: Yuki Arai, Tomohiro Hayashi
  This work is licensed under a Creative Commons Attribution 4.0 International License. Cite this article Yuki Arai and Tomohiro Hayashi , Characterization of Polymerized Layer of Alkylsilane on Surfaces of Silica Filler Materials by Force Spectroscopic Measurements Using Atomic Force Microscope, Sens. Mater., Vol. 34, No. 11, 2022, p. 3959-3965. |
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