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Notice of retraction
Vol. 34, No. 8(3), S&M3042

Notice of retraction
Vol. 32, No. 8(2), S&M2292

Print: ISSN 0914-4935
Online: ISSN 2435-0869
Sensors and Materials
is an international peer-reviewed open access journal to provide a forum for researchers working in multidisciplinary fields of sensing technology.
Sensors and Materials
is covered by Science Citation Index Expanded (Clarivate Analytics), Scopus (Elsevier), and other databases.

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S&M3681 Research Paper of Special Issue
Published in advance: May 20, 2024

Development of Automatic Visual Anomaly Detection System for Data Centers [PDF]

Misheel Enkhbaatar and Tatsuya Yamazaki

(Received Feburuary 6, 2024; Accepted May 16, 2024)

Keywords: automatic monitoring, anomaly detection, LED, image segmentation

In this paper, we present a practical automated visual monitoring system designed to enhance the efficiency of visual inspection in data centers. Visual inspection is a manual process of detecting failures in electronic devices based on light-emitting diode (LED) lighting. The objective of data center monitoring is to implement real-time failure detection to prevent any service disruptions or loss of user data. To improve the reliability of data centers, we propose a monitoring system that automatically detects anomalies in electronic devices. The system integrates a digital camera and a novel algorithm that is tailored to distinguish normal LED lighting patterns from abnormal patterns. Experimental data were collected in an actual data center room and the system was evaluated with experiments involving LED region segmentation and anomaly detection. For the LED segmentation task, we propose a K-means-based method that outperformed a previous method based on background subtraction by 8%. For anomaly detection, recorded videos covering continuous monitoring of approximately 17 h were used. The proposed method successfully detected all five true anomalies in the video data. The results of another experiment for anomaly detection demonstrate that prolonged video recording for collecting patterns of LED lighting can positively contribute to a better understanding of normal patterns and can effectively be used to ensure the detection of device anomalies.

Corresponding author: Misheel Enkhbaatar




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