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Vol. 32, No. 8(2), S&M2292

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Sensors and Materials, Volume 37, Number 5(2) (2025)
Copyright(C) MYU K.K.
pp. 1915-1923
S&M4028 Research Paper of Special Issue
https://doi.org/10.18494/SAM5513
Published: May 23, 2025

Chemical Analysis of CdMnTeSe Surface Treated with Sodium Hypochlorite and Potassium Permanganate via X-ray Photoelectron Spectroscopy [PDF]

Jangwon Byun, Taejoon Mo, Younghak Kim, Jiwon Seo, Seungho Song, Jichul Seo, Hansoo Kim, Masanori Koshimizu, and Beomjun Park

(Received December 24, 2024; Accepted March 18, 2025)

Keywords: room-temperature semiconductor detector, sodium hypochlorite, potassium permanganate, surface passivation, oxidation

We grew a Cd0.95Mn0.05Te0.98Se0.02 (CMTS) semiconductor, which is the next-generation gamma-ray detector operating at room temperature, via the Bridgman method. During Br etching, one of the fabrication processes for CdTe-based semiconductors, a Te-rich layer is formed on the surface of the crystal, and this Te-rich surfaces act as the charge carrier source and trapping center of photo-generated carriers. To oxidize this Te-rich layer, we introduced sodium hypochlorite (NaOCl) and potassium manganate (KMnO4) into CMTS crystals, and then characterized the chemical state of the surface via X-ray photoelectron spectroscopy (XPS). The spectroscopic properties of the surface-treated CMTS were confirmed, indicating potential oxidation when precise passivation was settled

Corresponding author: Beomjun Park


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Cite this article
Jangwon Byun, Taejoon Mo, Younghak Kim, Jiwon Seo, Seungho Song, Jichul Seo, Hansoo Kim, Masanori Koshimizu, and Beomjun Park, Chemical Analysis of CdMnTeSe Surface Treated with Sodium Hypochlorite and Potassium Permanganate via X-ray Photoelectron Spectroscopy, Sens. Mater., Vol. 37, No. 5, 2025, p. 1915-1923.



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