pp. 763-768
S&M1235 Research Paper https://doi.org/10.18494/SAM.2016.1249 Published: July 27, 2016 Development of a Compact X-ray Source and Detector System for High-Throughput, Fully Autonomous Inspection [PDF] Hidetoshi Kato, Takeshi Fujiwara, Brian E. O'Rourke, Hiroyuki Toyokawa, Akifumi Koike, Toru Aoki, and Ryoichi Suzuki (Received Septemeber 4, 2015; Accepted January 8, 2016) Keywords: nondestructive inspection, X-ray, CdTe
We have developed a compact X-ray source using a carbon nanostructure electron emitter and an X-ray imaging camera using a CdTe semiconductor and a pixelated readout circuit for the automated X-ray inspection of metal structures such as industrial pipelines. Both the X-ray source and the detector are compact, lightweight, and battery-driven, operate with low power consumption, and generate and detect sufficiently energetic X-rays. We have also evaluated the spatial and area density resolutions by X-ray inspection test and made a comparison with commercially available products. The combination of our X-ray source and CdTe detector resulted in superior spatial and density resolutions, mainly bacause the detection efficiency was higher than those of the other commercially available products used in this study.
Corresponding author: Hidetoshi KatoCite this article Hidetoshi Kato, Takeshi Fujiwara, Brian E. O'Rourke, Hiroyuki Toyokawa, Akifumi Koike, Toru Aoki, and Ryoichi Suzuki, Development of a Compact X-ray Source and Detector System for High-Throughput, Fully Autonomous Inspection, Sens. Mater., Vol. 28, No. 7, 2016, p. 763-768. |