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Notice of retraction
Vol. 34, No. 8(3), S&M3042

Notice of retraction
Vol. 32, No. 8(2), S&M2292

Print: ISSN 0914-4935
Online: ISSN 2435-0869
Sensors and Materials
is an international peer-reviewed open access journal to provide a forum for researchers working in multidisciplinary fields of sensing technology.
Sensors and Materials
is covered by Science Citation Index Expanded (Clarivate Analytics), Scopus (Elsevier), and other databases.

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Sensors and Materials, Volume 36, Number 11(3) (2024)
Copyright(C) MYU K.K.
pp. 4881-4902
S&M3837 Research Paper of Special Issue
https://doi.org/10.18494/SAM5107
Published: November 25, 2024

Improved Reparameterization You-Only-Look-Once v5 Model for Strip-steel Surface Defect Detection [PDF]

Sijie Qiu, Chi-Hsin Yang, Long Wu, Wenqi Song, and Jian-Zhou Pan

(Received April 30, 2024; Accepted October 8, 2024)

Keywords: surface defect detection, RepVGG–Light module, bidirectional feature pyramid network (BiFPN), normalized Gaussian-Wasserstein distance (NGWD)

In this study, we propose a reparameterization You-Only-Look-Once v5 (YOLOv5) algorithm model for strip-steel surface defect detection to address low precision and poor timeliness in traditional methods. The proposed model introduces a re-parameterized VGG Light module, an enhanced bidirectional feature pyramid network feature structure, and a bounding box regression loss function fused with a normalized Gaussian-Wasserstein distance metric to improve small target defect detection accuracy. The experimental findings reveal a mean average precision (mAP) of 82.1% on the NEU-DET dataset, representing a notable improvement of 4.1% over the baseline YOLOv5s algorithm. Furthermore, the proposed algorithm model demonstrates superior detection accuracy compared with other prevalent object detection models and effectively mitigates challenges such as false detections and missed detections of small targets. Notably, it achieves an impressive detection speed of 68 FPS, affirming its efficacy in real-time applications.

Corresponding author: Chi-Hsin Yang


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This work is licensed under a Creative Commons Attribution 4.0 International License.

Cite this article
Sijie Qiu, Chi-Hsin Yang, Long Wu, Wenqi Song, and Jian-Zhou Pan, Improved Reparameterization You-Only-Look-Once v5 Model for Strip-steel Surface Defect Detection, Sens. Mater., Vol. 36, No. 11, 2024, p. 4881-4902.



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