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Vol. 32, No. 8(2), S&M2292

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Online: ISSN 2435-0869
Sensors and Materials
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Sensors and Materials, Volume 15, Number 2 (2003)
Copyright(C) MYU K.K.
pp. 83-92
S&M511 Research Paper of Special Issue
Published: 2003

Anisotropic Si Etching Condition for Preparing Optically Smooth Surfaces [PDF]

Minoru Sasaki, Takehiro Fujii and Kazuhiro Hane

(Received September 30, 2002; Accepted January 14, 2003)

Keywords: surface roughness, {110} surface, anisotropic etching, microcavity

A combination of dry and wet anisotropic Si etching has been found to be useful for preparing hexagonal holes having smooth sidewall surfaces. The dry etching defines the main shape, and the subsequent short-time wet etching smoothens the sidewall of the{110} surface. The etchant used is made up of ethylenediamine pyrocatechol and water.The surface roughness is quantitatively investigated for improving the sidewall smoothness.The angular alignment accuracy between the pattern and the crystallographicorientation is found to be important. The triangular etching pit obtained by the dummyetching is used for confirming the crystallographic orientation. The surface roughness of <20 nm Ra is repeatedly obtained. The solid polymer dye microcavity laser is fabricated as a replica of the Si structure obtained. The lasing spectra from microcavities show the higher Q value.


Cite this article
Minoru Sasaki, Takehiro Fujii and Kazuhiro Hane, Anisotropic Si Etching Condition for Preparing Optically Smooth Surfaces, Sens. Mater., Vol. 15, No. 2, 2003, p. 83-92.



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