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Vol. 34, No. 8(3), S&M3042

Notice of retraction
Vol. 32, No. 8(2), S&M2292

Print: ISSN 0914-4935
Online: ISSN 2435-0869
Sensors and Materials
is an international peer-reviewed open access journal to provide a forum for researchers working in multidisciplinary fields of sensing technology.
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Sensors and Materials, Volume 32, Number 10(2) (2020)
Copyright(C) MYU K.K.
pp. 3261-3272
S&M2337 Research Paper
https://doi.org/10.18494/SAM.2020.2851
Published: October 20, 2020

Pixel Dark Current Calibration Method to Reduce Dark Fixed Pattern Noise in Amorphous Silicon Bolometer-type Uncooled Infrared Image Sensor [PDF]

Sang-Hwan Kim, Jimin Lee, Hyeunwoo Kwen, Jae-Hyoun Park, Kyoung-Il Lee, and Jang-Kyoo Shin

(Received May 12, 2020; Accepted August 13, 2020)

Keywords: infrared image sensor, bolometer, amorphous-silicon, dark fixed pattern noise, 2D infrared image

In this paper, we propose a pixel dark current calibration method to reduce dark fixed pattern noise in an amorphous silicon bolometer-type uncooled infrared image sensor. This dark current calibration method utilizes an active pixel, a reference pixel, and a calibration circuit. The active and reference pixels were fabricated entirely from amorphous silicon. Even if amorphous silicon components with the same resistance are manufactured, there may be variations in resistance owing to process deviations during the manufacture of the amorphous silicon pixels. Dark fixed pattern noise due to resistance variations causes non-uniformity among the output voltages of the pixels. The operating principle of the pixel dark current calibration method to reduce dark fixed pattern noise is thus based on the subtraction of the averaged dark current of the active pixel from that of the reference pixel. The proposed pixel dark current calibration method is implemented by a chip consisting of an amorphous silicon bolometer pixel array, a calibration circuit, and column readout circuits. The entire chip was fabricated using a 0.11 μm CMOS image sensor process and its performance was evaluated.

Corresponding author: Jang-Kyoo Shin


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This work is licensed under a Creative Commons Attribution 4.0 International License.

Cite this article
Sang-Hwan Kim, Jimin Lee, Hyeunwoo Kwen, Jae-Hyoun Park, Kyoung-Il Lee, and Jang-Kyoo Shin, Pixel Dark Current Calibration Method to Reduce Dark Fixed Pattern Noise in Amorphous Silicon Bolometer-type Uncooled Infrared Image Sensor, Sens. Mater., Vol. 32, No. 10, 2020, p. 3261-3272.



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