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Vol. 34, No. 8(3), S&M3042

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Sensors and Materials, Volume 35, Number 8(3) (2023)
Copyright(C) MYU K.K.
pp. 2961-2970
S&M3367 Letter
Published: August 24, 2023

Calibration of NaI (Tl) Scintillation Survey Meter Using Industrial X-ray Equipment [PDF]

Katsunao Suzuki, Toru Negishi, Yoh Kato, Yasuhisa Kono, and Michiharu Sekimoto

(Received April 28, 2023; Accepted July 31, 2023)

Keywords: NaI (Tl) scintillation survey meter, calibration, industrial X-ray equipment, additional filter, calibration factor

We calculated an additional filter that can greatly attenuate the dose rate compared with the N-80 and N-100 X-ray calibration fields specified in ISO 4037-1 but with almost the same radiation quality. Using the Surface Dose Evaluation Code ver. 17 simulation software of Laboratory of Medical Radiology Technology and the Particle and Heavy Ion Transport System code of Japan Atomic Energy Agency, additional filters whose half-valent layers are almost the same as those of N-80 and N-100 were calculated. Next, we performed actual measurements using industrial X-ray equipment and confirmed that they were in agreement with the simulation results. Furthermore, we calibrated an NaI (Tl) scintillation survey meter and compared it with the calibration factors of a 137Cs source. By setting additional filters of 2.5 mm Al + 1.0 mm Cu + 1.0 mm Ta at 80 kV and 2.5 mm Al + 2.0 mm Cu + 2.0 mm Pb at 100 kV, radiation quality similar to those of N-80 and N-100 was achieved. It was also found that the dose rate was significantly attenuated. The calibration factors of the survey meter were almost the same as the energy characteristics. We found that NaI (Tl) scintillation survey meters can be calibrated using industrial X-ray equipment.

Corresponding author: Katsunao Suzuki

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Cite this article
Katsunao Suzuki, Toru Negishi, Yoh Kato, Yasuhisa Kono, and Michiharu Sekimoto, Calibration of NaI (Tl) Scintillation Survey Meter Using Industrial X-ray Equipment, Sens. Mater., Vol. 35, No. 8, 2023, p. 2961-2970.

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