The microwave dielectric properties of NdTi(0.5−x)GexMo0.5O4 were examined using densification and X-ray diffraction (XRD) patterns. As x increased from 0 to 0.05, the unit cell volume decreased, indicating that the Ge4+ ions were incorporated within the Ti4+ ions. After sintering at 1425 °C for 4 h, the Nd(Ti0.49Ge0.01Mo0.5)O4 ceramics achieved a maximum relative density of 98.9%. The unloaded quality factor (Qu × f) of the ceramic NdTi0.49Ge0.01Mo0.5O4, which was sintered at 1425 °C for 4 h, was 33,400 GHz (at 17.6 GHz). Additionally, it possessed a dielectric constant (εr) of 17.6 and the obtained temperature coefficient of resonant frequency (τf) was −30.8 ppm/oC. In addition, ceramic was used as a substrate for slot antenna liquid sensor application. We demonstrated how to improve the measurement results as well as the methodology for obtaining the results. As the water content in acetone increased from 0 to 100%, the measured resonant frequencies shifted from 2.6 to 2.0 GHz.