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Vol. 32, No. 8(2), S&M2292

Print: ISSN 0914-4935
Online: ISSN 2435-0869
Sensors and Materials
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Sensors and Materials, Volume 34, Number 2(2) (2022)
Copyright(C) MYU K.K.
pp. 669-675
S&M2840 Research Paper of Special Issue
https://doi.org/10.18494/SAM3698
Published in advance: January 12, 2022
Published: February 21, 2022

Photo- and Radioluminescence Properties of Eu3+-doped Y2O3 Thick Film Phosphor Prepared via Chemical Vapor Deposition [PDF]

Shogen Matsumoto, Taiga Watanabe, and Akihiko Ito

(Received October 17, 2021; Accepted November 25, 2021)

Keywords: Y2O, CVD, thick film phosphor, photoluminescence, radioluminescence

We demonstrate the high-speed epitaxial growth of a Eu3+-doped Y2O3 (Eu3+:Y2O3) thick film phosphor grown on a (100) yttria-stabilized zirconia substrate by laser-assisted metal–organic CVD. The deposition rate was 42 μm h−1 and the resultant 7-μm-thick Eu3+:Y2O3 film was optically transparent. Under UV and X-ray irradiation, the Eu3+:Y2O3 thick film emitted red light originating from the 5D0→7F2 t ransition of Eu3+ ions with a fluorescence decay time of 1.7 ms.

Corresponding author: Akihiko Ito


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Cite this article
Shogen Matsumoto, Taiga Watanabe, and Akihiko Ito, Photo- and Radioluminescence Properties of Eu3+-doped Y2O3 Thick Film Phosphor Prepared via Chemical Vapor Deposition, Sens. Mater., Vol. 34, No. 2, 2022, p. 669-675.



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