pp. 597-605
S&M3549 Research Paper of Special Issue https://doi.org/10.18494/SAM4755 Published: February 20, 2024 Radio-photoluminescence Properties of Sm-doped HfO2–Al2O3–SiO2 Glass Ceramics [PDF] Akihiro Nishikawa, Daiki Shiratori, Takumi Kato, Daisuke Nakauchi, Noriaki Kawaguchi, and Takayuki Yanagida (Received October 19, 2023; Accepted January 11, 2024) Keywords: glass ceramics, X-ray imaging, radio-photoluminescence, Sm
In this study, Sm-doped HfO2–Al2O3–SiO2 glass ceramics with different Sm concentrations (0.1, 0.3, 1.0, and 3.0%) were synthesized by the melt quenching method using a floating zone (FZ) furnace. Their photoluminescence properties, including radio-photoluminescence and spatial resolution, were investigated. The 0.1 and 0.3% Sm-doped samples indicated the luminescence of Sm3+, and the 1.0% Sm-doped sample showed the luminescence of Sm2+ and Sm3+. Alternatively, the 3.0% Sm-doped sample mainly showed the luminescence of Sm2+. The radio-photoluminescence phenomenon (Sm3+ → Sm2+) was observed in the 0.1–1.0% Sm-doped samples. In addition, the 1.0% Sm-doped sample had a spatial resolution of 10 LP/mm.
Corresponding author: Akihiro NishikawaThis work is licensed under a Creative Commons Attribution 4.0 International License. Cite this article Akihiro Nishikawa, Daiki Shiratori, Takumi Kato, Daisuke Nakauchi, Noriaki Kawaguchi, and Takayuki Yanagida, Radio-photoluminescence Properties of Sm-doped HfO2–Al2O3–SiO2 Glass Ceramics, Sens. Mater., Vol. 36, No. 2, 2024, p. 597-605. |