pp. 2507-2511
S&M4070 Research Paper of Special Issue https://doi.org/10.18494/SAM5560 Published in advance: Published: June 25, 2025 Study and Fabrication of Ga2O3 Thin Films Using Thermal Evaporation [PDF] Ching-Fang Tseng, Ya-Chin Chiang, and Cheng-Hsing Hsu (Received January 18, 2025; Accepted May 29, 2025) Keywords: Ga2O3 thin films, thermal evaporation, electrical properties
In this study, we deposited Ga2O3 thin films on Si substrates by thermal evaporation and investigated the effects of surface morphology and electrical properties on various thermal treatments. Diffraction patterns indicated that the annealed films had a polycrystalline microstructure and that the grain size of Ga2O3 thin films increased with annealing temperature. These results indicate that suitable processing parameters are beneficial in terms of improving the microstructure and electrical performance of Ga2O3 thin films. The Ga2O3 thin films are suitable for use as a thin-film transistor or sensor.
Corresponding author: Ching-Fang Tseng![]() ![]() This work is licensed under a Creative Commons Attribution 4.0 International License. Cite this article Ching-Fang Tseng, Ya-Chin Chiang, and Cheng-Hsing Hsu, Study and Fabrication of Ga2O3 Thin Films Using Thermal Evaporation, Sens. Mater., Vol. 37, No. 6, 2025, p. 2507-2511. |