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Vol. 34, No. 8(3), S&M3042

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Sensors and Materials
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Sensors and Materials, Volume 25, Number 3 (2013)
Copyright(C) MYU K.K.
pp. 165-176
S&M911 Research Paper of Special Issue
https://doi.org/10.18494/SAM.2013.844
Published: March 28, 2013

Growth and Evaluation of Bulk GaN Crystals Grown on a Point Seed Crystal by Ba-Added Na Flux Method [PDF]

Hiroki Imabayashi, Kosuke Murakami, Daisuke Matsuo, Yuma Todoroki, Hideo Takazawa, Akira Kitamoto, Mihoko Maruyama, Mamoru Imade, Masashi Yoshimura and Yusuke Mori

(Received November 26, 2012; Accepted February 12, 2013)

Keywords: GaN wafer, bulk single crystal, crystal growth, point seed, Na flux method

We grew bulk gallium nitride (GaN) single crystals on a point seed by using the Ba-added Na flux method and evaluated their structural and optical properties. As a result, we successfully grew habit-controlled single GaN crystals. The size of the largest crystal in this study was 7 mm along the [0001] direction and 9 mm along the ⟨11-20⟩ direction after 200 h of growth. The cathodoluminescence (CL) images of (10-10) GaN wafers sliced from the grown crystal revealed that large areas of the wafer were dislocation free. Full widths at half maximum (FWHMs) of the X-ray rocking curve (XRC) of GaN (10-10) at low-dislocation-density sectors were from 32 to 61 arcsec. No green and yellow luminescence (GL and YL, respectively) peaks were detected from the room-temperature photoluminescence spectrum. From these results, it is found that the Ba-added Na flux method of GaN crystal growth on a point seed opens the possibility of fabricating high-quality prismatic GaN bulk single crystals.

Corresponding author: Mamoru Imade


Cite this article
Hiroki Imabayashi, Kosuke Murakami, Daisuke Matsuo, Yuma Todoroki, Hideo Takazawa, Akira Kitamoto, Mihoko Maruyama, Mamoru Imade, Masashi Yoshimura and Yusuke Mori, Growth and Evaluation of Bulk GaN Crystals Grown on a Point Seed Crystal by Ba-Added Na Flux Method, Sens. Mater., Vol. 25, No. 3, 2013, p. 165-176.



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