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Sensors and Materials, Volume 37, Number 11(2) (2025)
Copyright(C) MYU K.K.
pp. 4903-4918
S&M4221 Research Paper
https://doi.org/10.18494/SAM5839
Published: November 19, 2025

Synthetic-data-driven You-Only-Look-Once–Based Detection of Computer Numerical Control Machining Chips: Comparative Analysis of Omniverse Generated and Manually Annotated Images [PDF]

Ta-Jen Peng, Jr-Rung Chen, En-Cheng Liou, Yen-Ling Lin, and Sheng-Wei Wang

(Received July 7, 2025; Accepted November 11, 2025)

Keywords: CNC machining, chip detection, synthetic data, NVIDIA Omniverse, YOLO model

With the increasing automation of production lines, chip residues generated during computer numerical control (CNC) machining may result in tool damage, equipment malfunctions, unscheduled downtime, and increased maintenance costs if not promptly identified and managed. To address this problem, we propose a synthetic data generation framework that integrates 2D image-based modeling with the NVIDIA Omniverse simulation platform to rapidly produce large-scale annotated datasets of cutting tool chips. These synthetic datasets were subsequently employed for training a You Only Look Once (YOLO) object detection model. A comparative analysis was performed between synthetic images generated by Omniverse and manually annotated real images, evaluating their detection performance and labeling costs. Experimental results demonstrated that synthetic data significantly reduces manual labeling efforts while maintaining high detection accuracy. The proposed system facilitates the early detection of abnormal chipping or chip entanglement, providing actionable insights for preventive maintenance and adaptive machining scheduling. Consequently, this approach enhances intelligent tool condition monitoring and predictive maintenance capabilities, thus offering essential technological support for smart manufacturing and automated production lines.

Corresponding author: Ta-Jen Peng


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This work is licensed under a Creative Commons Attribution 4.0 International License.

Cite this article
Ta-Jen Peng, Jr-Rung Chen, En-Cheng Liou, Yen-Ling Lin, and Sheng-Wei Wang, Synthetic-data-driven You-Only-Look-Once–Based Detection of Computer Numerical Control Machining Chips: Comparative Analysis of Omniverse Generated and Manually Annotated Images, Sens. Mater., Vol. 37, No. 11, 2025, p. 4903-4918.



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